Semiconductor Test Equipment Chemicals
Showing all 4 results
-
De-Ox™
De-Ox is a de-oxidizer that will remove tin, lead oxides as well as other oxides from contact surfaces minimizing resistance levels and restoring semiconductor test sockets to optimal performance. De-Ox deoxidizes without “activating” the metal surface therefore subsequent re-growth of oxides is not altered. De-Ox removes only oxides, and will not attack most metals, except zinc and aluminum.
-
De-Ox™ II
De-Ox II is a de-oxidizer that will remove tin, lead oxides as well as other oxides from contact surfaces minimizing resistance levels and restoring semiconductor test sockets to optimal performance. De-Ox II deoxidizes without “activating” the metal surface therefore subsequent re-growth of oxides is not altered. De-Ox II removes only oxides, and will not attack most metals, except zinc and aluminum. De-Ox II does not attack plastic surfaces in test sockets.
-
De-Ox™ Ultra
De-Ox Ultra is a de-oxidizer that will remove tin, lead oxides as well as other oxides from contact surfaces minimizing resistance levels and restoring semiconductor test sockets to optimal performance. De-Ox Ultra deoxidizes without “activating” the metal surface therefore subsequent re-growth of oxides is not altered. De-Ox Ultra removes only oxides, and will not attack most metals, except zinc and aluminum. De-Ox Ultra does not attack plastic surfaces in test sockets.
-
ProbeWash™
ProbeWash is a de-oxidizer that will remove aluminum contaminants and other oxides from contact surfaces. ProbeWash deoxidizes without “activating” the metal surface. As a result, probe resistance levels are returned to original levels. ProbeWash removes only oxides and will not attack most metals, except aluminum and zinc.
